MEMS-V

Square needle type probe card using MEMS processing
  • product_icon_precise高精準測量
  •  product_icon_low_noise低噪音
  • product_icon_one_hand 可單手操作
  • Probe cards for logic devices, particularly in the automotive market
  • New MEMS probe-resistant and long life with high-hardness material
  • High and low temperature testing in a large probing area is also possible
  • The probe position accuracy is high, achieving stable contact resistance
  • Supports fine-pitch devices
  • Can perform single pin replacement for ease of maintenance
  • FPD Products

    FPD Products

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  • Probe Card

    Probe Card

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  • Wafer Prober

    Wafer Prober

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  • Tester

    Tester

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  • Test Socket

    Test Socket

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