Equipment to determine the pass/fail of devices in the wafer inspection process and the final inspection process after packaging. MJC can provide both hard and soft test solutions to suit your needs, from IC semiconductor development and defect analysis to mass production. We will develop custom testers and test systems with selected functions to suit the test environment or budget.

• New test modules can be provided on demand to test a wide range of devices
• Building test solutions for various type of devices or by adding software to meet needs
• The Main Body can be selected from 3 types (Full/Half/Quarter) depending on the test modules configuration
• Space-saving with built-in power supply and PC control in the housing Platform