Semiconductor series
In semiconductor development, wafer probe is mainly used for IC characteristic evaluation, reliability evaluation and defect analysis in wafer manufacturing process. It carries out high-precision measurement and evaluation of test element group (TEG), including process characteristics and electrical verification.
Category
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Prober for Evaluation/Analysis
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Accessories/Options
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- Manual 12"
- Manual 8"
- Manual 6"
- Semi Auto 8"
Prober for Evaluation/Analysis
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Manual Prober for Evaluation/Analysis(8 inch)
This series offers general-purpose manual probers for a variety of different types of evaluation and analysis.
These models can also be used for temperature characteristics evaluation and evaluation of high-voltage devices. -
Manual Prober for Evaluation/Analysis(6 inch)
This series offers general-purpose manual probers for a variety of different types of evaluation and analysis.
These models can also be used for temperature characteristics evaluation and evaluation of high-voltage devices. -
Manual Prober for Evaluation/Analysis(12 inch)
This model is a general-purpose manual prober for a wide variety of analyses of wafers up to 12 inches.
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Manual Prober for Low Current Measurement(8 inch)
This manual prober model can measure fA-level low current.
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Semi-Automatic Prober for Low Current Measurement(8 inch)
This high-performance semi-automatic prober can measure fA-level low current.
This model helps achieve both efficiency and accuracy in measurement and analysis.
Accessories/Options
Technology Introduction
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What is a wafer prober?
A wafer prober is a system used for electrical testing of wafers in the semiconductor development and manufacturing process.
