2024年4月22日

 
關於台灣花蓮地區賑災事宜

對於花蓮地區於2024年4月3日上午7點58分發生了

芮氏規模7.2地震造成的罹難者,我們深表哀悼。同時,我們

向受災者及相關人士致以誠摯的慰問。

 

Taiwan MJC為協助當地重建居民的家園、恢復居民的正常

生活及工作,承諾將善盡企業社會責任,我們已於4/22捐款

新台幣22萬元整,以支援受災者及家屬攜手渡過艱難時刻與恢復重建工作。

 

盼受災地區能盡快恢復舊貌。

What is semiconductor test equipment (IC tester)?

Semiconductor test equipment (IC tester), or automated test equipment (ATE), is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
Testers are roughly categorized into logic testers, memory testers, and analog testers. Normally, IC testing is conducted at two levels: the wafer test (also called die sort or probe test) that tests wafers, and the package test (also called final test) after packaging. Wafer testing uses a prober and a probe card, while package testing uses a handler and a test socket, together with a tester.

img_tester02

 
  • FPD Products

    FPD Products

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  • Probe Card

    Probe Card

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  • Wafer Prober

    Wafer Prober

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  • Tester

    Tester

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  • Test Socket

    Test Socket

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