Semiconductor series
Prober is a system used for electrical testing of wafers in the process of semiconductor development and manufacturing. MJC offers a wide range of product lineup of different types of evaluation and analysis, as well as a variety of accessories and options, from which you can choose according to your needs.
Category
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Advanced Probe Card
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Cantilever Type Probe Card
Advanced Probe Card
Cantilever Type Probe Card
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For Multi-Die and Peripheral Pad Layout Tests
This type of probe card is suitable for a peripheral pad layout IC with pads at four sides and for multi-die testing.
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For LCD Driver (Fine Pitch) Measurement
This type of probe card is suitable for LCD driver IC measurement.
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For Low Current Measurement
This type of probe card for low current measurement has a resolution of the order of 10fA.
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Needle Specifications for Small Pads(BC Probe)
The needle specifications adopt a simulated stress design that reduces the scrub amount of the needle tip in order to reduce device pad damage.
Technology Introduction
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What is a probe card?
A probe card is a jig used for electrical testing of an LSI (large-scale integrated circuit) chip on a wafer during the wafer test process in LSI manufacturing.
