Probe Card
半導體系列
晶圓探測器是一種用於在半導體開發和製造過程中對晶圓進行電氣測試的系統。
美科樂提供不同類型評估和分析的廣泛產品陣容，也提供多種配件和選項，您可以根據需要從中進行選擇。
Category
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Advanced Probe Card
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Cantilever Type Probe Card
Cantilever Type Probe Card
Technical Column
技術介紹
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What is a probe card?
A probe card is a jig used for electrical testing of an LSI (large-scale integrated circuit) chip on a wafer during the wafer test process in LSI manufacturing.
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