What is J-Contacts?

The J-Contacts series offers test sockets with contact terminals of the unique rigid type (integrated type) using elastomer (silicon rubber), as opposed to the leaf spring type often used for burn-in sockets. Therefore, J-Contacts features shorter contact terminals than conventional the leaf spring type and superior electrical characteristics, particularly high frequency characteristics.
Additionally, the smooth movement of the contact terminals helps achieve ideal contact with minimal damage to devices and DUT boards.
These test sockets are used in the final test process for quad flat package/small outline package (QFP/SOP) and quad flat non-lead package/small outline non-lead package (QFN/SON).

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  • FPD

    FPD

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  • Probe Card

    Probe Card

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  • Wafer Prober

    Wafer Prober

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  • Tester

    Tester

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  • Test Socket

    Test Socket

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